Michael Postek

B.A., M.S., Ph.D. ·

wimauma, Florida

Technology Management

Scanning Electron Microscopy

Metrology

Nanotechnology

Nanomanufacturing

Electron Microscopy

Dimensional Metrology

Nanometrology

Instrumentation

Standards

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Microscopy

Electron Beam Interaction Modeling

Semiconductor Metrology

Photomask Metrology

Cellulose Nanomaterials

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