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Michael Postek
B.A., M.S., Ph.D. ·
wimauma, Florida
Technology Management
Scanning Electron Microscopy
Metrology
Nanotechnology
Nanomanufacturing
Electron Microscopy
Dimensional Metrology
Nanometrology
Instrumentation
Standards
Microscopy
Electron Beam Interaction Modeling
Semiconductor Metrology
Photomask Metrology
Cellulose Nanomaterials
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