Joseph McAlexander
P.E. ·
richardson, Texascircuit design and analysis
device fabrication and assembly
testing
marketing
control system design and analysis
manufacturing operations
quality
reliability
defect / failure analysis
IP management and licensing
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Dynamic Random Access Memories (DRAMs)
Static Random Access Memories (SRAMs)
Charge Coupled Devices (CCDs)
Shift Registers (SRs)
functional circuits including I/O buffers for address and data, decoders, clocks, sense amplifiers, fault tolerant, parallel-to-serial data paths for video applications, level shifters, converters, pumps, and logic
wireless communication systems
MEMs applications
volatile and non-volatile memory
mechanical calibration and measuring equipment, including optical, scanning e-beam, IR, capacitive, and laser using phase contrast and Fast Fourier Transform (FFT) for High Aspect Ratio Inspection (HARI) applications
audio and video system design and installation
solid state device physics
integrated circuit design
integrated circuit fabrication
statistical control
nuclear radiation hardness testing
audio sound and video systems design and installation
Engineering
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